Fully Automatic First Article Inspection System FAI-i177

Enhance your SMT inspections with the fast, accurate, and reliable FAI-i177 system.

• The system automatically recognizes the customer's BOM and CAD position drawing, generating the test program within 5 minutes without modifying the data.
• It switches test gears, reads values, compares them with the BOM, and determines PASS or NG.
• Supports searching for untested devices, NG components, and specific material numbers.
• For chips, diodes, and silk-screened resistors, it automatically identifies silk-screening, orientation, and polarity.
• Standard sample storage allows data retrieval for the same substrate type without re-importing.
• After testing, it generates a report with device images and PCBA information, which can be archived, printed, and emailed.